Detection of sample parameters in secondary electron microscope images (test results)

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4735, Issue , 2002, Pages 104-112

  Mahadevan, Sowmya ^a   Casasent, David ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Edge detection; Gabor filters; SEM image processing; Triple junction parameterization

Indexed keywords

ALGORITHMS; EDGE DETECTION; GRAIN BOUNDARIES; IMAGE PROCESSING;

GABOR FILTERS; SECONDARY ELECTRON MICROSCOPE IMAGES;

ELECTRON MICROSCOPES;

EID: 0036385180     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.470107     Document Type: Conference Paper

References (7)

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3. C. T. Wu, B.L. Adams, C.L. Bauer, D. Casasent, A. Morawiec, S. Ozdemir and A. Talukder, "Mapping the Mesoscale Interface Structure in Polycrystalline Materials," Met. Trans. 1999, submitted.
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5. S. Ozdemir and D. Casasent, "Scale-Space Median and Gabor Filtering for Boundary Detection in Electron Microscopy Images", Proc. SPIE Vol.3715 (1999).
6. J. P. Kapur, D. Casasent, 'Geometric Correction of SEM images', Proc. SPIE vol. 4044, #23, April 2000.
7. S. Mahadevan and D. Casasent, "Detection of triple junction parameters in microscope images", Proc. SPIE, Vol. 4387 (2001), pp. 204-214