Detection of bands in backscatter microscopy images using new Hough transform techniques

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3389, Issue , 1998, Pages 72-83

  Casasent, David ^a   Chen, Linsen ^a   Talukder, Ashit ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Hough transform; Image processing; Microscope image analysis; Radon transform

Indexed keywords

BACKSCATTERING; FEATURE EXTRACTION; HOUGH TRANSFORMS;

CRYSTALLOGRAPHIC STRUCTURE; ELECTRON BACK-SCATTER PATTERNS; GRAIN ORIENTATION; MATERIAL SCIENCE; MICROSCOPE IMAGES; MICROSCOPY IMAGES; POSTPROCESSING ALGORITHMS; RADON TRANSFORM;

IMAGE PROCESSING;

EID: 0010577341     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.316530     Document Type: Conference Paper

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