SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 689, Issue , 2002, Pages 329-336

Engineered microstructures and transport properties in YBCO coated conductors

(6) Holesinger, T G a Gibbons, B J a Coulter, J Y a Foltyn, S R a Groves, J R a Arendt, P N a

a LOS ALAMOS NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CURRENT DENSITY; DEPOSITION; INTERFACES (MATERIALS); OXIDE SUPERCONDUCTORS; SUPERCONDUCTING FILMS; TEXTURES; THICKNESS MEASUREMENT; TRANSPORT PROPERTIES;

BUFFER LAYERS; COATED CONDUCTORS; FILM STRUCTURE; INTERFACIAL REACTIONS;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0036352362 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.