Stressed states and self-organized structuring of W/C multilayers

Materials Research Society Symposium - Proceedings

Volumn 695, Issue , 2002, Pages 459-464

  Meyer, D C ^a   Klingner, A ^a   Leisegang, T ^a   Holz, T ^a   Dietsch, R ^a   Paufler, P ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; CHARACTERIZATION; CHEMICAL ANALYSIS; LASER APPLICATIONS; OPTICAL MICROSCOPY; REFLECTOMETERS; RELAXATION PROCESSES; STRESSES; SURFACE PROPERTIES; TUNGSTEN; X RAY OPTICS;

LASER MAPPING DEVICE; SELF ORGANIZING STRUCTURING; STRESSED STATES; THERMALLY STIMULATED RELAXATION BEHAVIOR; WIDE ANGLE DIFFRACTOMETRY; X RAY REFLECTOMETRY;

MULTILAYERS;

EID: 0036351986     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)