The nanostructures of amorphous silicas

Microscopy and Microanalysis

Volumn 8, Issue 1, 2002, Pages 29-34

  Hobbs, Linn W ^a   Yuan, Xianglong ^a   Qin, L C ^a   Pulim, Vinay ^b   Coventry, Alexander ^c  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Amorphous; Electron diffraction; First sharp diffraction peak; Medium range order; Molecular dynamics simulation; Network structure; Rings; Silica; Topology

Indexed keywords

SILICON DIOXIDE;

CHEMICAL STRUCTURE; CHEMISTRY; CONFERENCE PAPER; CRYSTALLIZATION; ELECTRON MICROSCOPY; METHODOLOGY; NANOTECHNOLOGY; X RAY DIFFRACTION;

CRYSTALLIZATION; MICROSCOPY, ELECTRON; MODELS, MOLECULAR; NANOTECHNOLOGY; SILICON DIOXIDE; X-RAY DIFFRACTION;

EID: 0036344488     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602010061     Document Type: Conference Paper

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