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Volumn 67, Issue 4, 2002, Pages 279-289
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The growth and optical properties of Bi12SiO20 single crystals
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Author keywords
Bismuth silicon oxide single crystals; Critical diameter; Critical rate of rotation; Czochralski technique; Optical properties
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Indexed keywords
CHEMICAL COMPOUND;
ANALYTIC METHOD;
ARTICLE;
CALCULATION;
CHEMICAL ANALYSIS;
CRYSTALLIZATION;
HYDRODYNAMICS;
MELTING POINT;
METHODOLOGY;
REFLECTOMETRY;
ROTATION;
TEMPERATURE;
X RAY POWDER DIFFRACTION;
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EID: 0036335292
PISSN: 03525139
EISSN: None
Source Type: Journal
DOI: 10.2298/JSC0204279G Document Type: Article |
Times cited : (15)
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References (29)
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