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Volumn 91, Issue 1-4, 2002, Pages 177-183
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Orientation and relocation of biphenyl thiol self-assembled monolayers under sliding
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Author keywords
Atomic force microscopy; Friction; Orientation; Self assembled monolayers; Wear
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Indexed keywords
ELECTRON BEAM LITHOGRAPHY;
FRICTION;
MOLECULAR ORIENTATION;
ORGANIC COMPOUNDS;
SELF ASSEMBLY;
WEAR OF MATERIALS;
MOLECULAR CHAINS;
ATOMIC FORCE MICROSCOPY;
BIPHENYL DERIVATIVE;
THIOL DERIVATIVE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
FRICTION;
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EID: 0036323766
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(02)00098-0 Document Type: Article |
Times cited : (15)
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References (13)
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