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Volumn 47, Issue 12, 2002, Pages 990-993
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STM and XPS study on the self-assembled films of Schiff base on copper surface
a a a a a |
Author keywords
Schiff base; Self assembly; STM; XPS
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Indexed keywords
COPPER;
SCHIFF BASE;
ANALYTIC METHOD;
ARTICLE;
FILM;
MONOLAYER CULTURE;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
SURFACE PROPERTY;
TECHNIQUE;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 0036313601
PISSN: 10016538
EISSN: None
Source Type: Journal
DOI: 10.1360/02tb9222 Document Type: Article |
Times cited : (8)
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References (11)
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