Capillarity at the nanoscale: An AFM view

Journal of Adhesion Science and Technology

Volumn 16, Issue 7, 2002, Pages 951-964

  Mugele, F ^a   Becker, T ^a   Nikopoulos, R ^a   Kohonen, M ^a   Herminghaus, S ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

atomic force microscopy; contact angle; interface potential; line tension; wetting; young equation

Indexed keywords

AFM; CONTACT LINES; DROP SIZE; FOUR-ORDER; INTERFACE POTENTIAL; LINE TENSION; LIQUID DROPLETS; NANO SCALE; OPTICAL CONTACT; OPTICAL MEASUREMENT; SOLID SUBSTRATES; THREE ORDERS OF MAGNITUDE; YOUNG EQUATION;

CONTACT ANGLE; DROPS; OPTICAL DATA PROCESSING; WETTING; ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; INTERFACES (MATERIALS); LIQUIDS; SUBSTRATES;

ATOMIC FORCE MICROSCOPY; CAPILLARITY;

YOUNG EQUATION;

EID: 0036300942     PISSN: 01694243     EISSN: 15685616     Source Type: Journal    
DOI: 10.1163/156856102760136490     Document Type: Article

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