Optical characterization of multilayer stacks used as phase-change media of optical disk data storage

Applied Optics

Volumn 41, Issue 2, 2002, Pages 370-378

  Liang, Rongguang ^a,b   Peng, Chubing ^a,b   Nagata, Kenichi ^c   Daly Flynn, Kelly ^d   Mansuripur, Masud ^a,b  

^a UNIVERSITY OF ARIZONA   (United States)

^b EASTMAN KODAK COMPANY   (United States)

^c PANASONIC CORPORATION   (Japan)

^d Energy Conversion Devices Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DIELECTRIC FILMS; LIGHT ABSORPTION; MULTILAYERS; OPTICAL FILMS; OPTICAL RECORDING; REFRACTIVE INDEX;

PHASE-CHANGE MATERIALS;

OPTICAL DISK STORAGE;

EID: 0036300888     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.000370     Document Type: Article

References (11)

1. H. J. Borg, P. W. M. Blom, B. A. J. Jacobs, B. Tieke, A. E. Wilson, I. P. D. Ubbens, and G. F. Zhou, “AgInSbTe materials for high-speed phase change recording, ” in Joint International Symposium on Optical Memory and Optical Data Storage 1999, S. Kubota, R. Katayama, and D. G. Stinson, eds., Proc. SPIE 3864, 191-193 (1999).
2. G. F. Zhou and B. A. J. Jacobs, “High performance media for phase change optical recording, ” Jpn. J. Appl. Phys. 38, 1625-1628 (1999).
3. H. Iwasaki, M. Harigaya, O. Nonoyama, Y. Kageyama, M. Takahashi, K. Yamada, H. Deguchi, and Y. Ide, “Completely erasable phase change optical disc: application of AgInSbTe mixed-phase system for rewritable CD, ” Jpn. J. Appl. Phys. 32, 5241-5247 (1993).
4. X. S. Miao, T. C. Chong, Y. M. Huang, K. G. Lim, P. K. Tan, and L. P. Shi, “Dependence of optical constants on film thickness of phase-change media, ” Jpn. J. Appl. Phys. 38, 1638-1641 (1999).
5. N. Kato, Y. Takeda, T. Fukano, T. Motohiro, S. Kawai, and H. Kuno, “Compositional dependence of optical constants and microstructures of GeSbTe thin films for Compact-Disc-Rewritable (CD-RW) readable with conventional CD-ROM drives, ” Jpn. J. Appl. Phys. 38, 1707-1708 (1999).
6. 2 interface, ” J. Opt. Soc. Am. 72, 1253-1257 (1982).
7. C. M. Margues, J. M. Frigerio, and J. Rivory, “Effective ellip-sometric thickness of an interfacial layer, ” J. Opt. Soc. Am. B 8, 2523-2528 (1991).
8. I. Awai and J. Ikenoue, “Effect of film transition layers on the Abeles method, ” Appl. Opt. 23, 1890-1896 (1984).
9. M. Yamaguchi, T. Togashi, S. Jinno, H. Kudo, E. Muramatsu, S. Taniguchi, and A. Inoue, “4.7 GB phase change optical disc with in-groove recording, ” Jpn. J. Appl. Phys. 38, 1806-1810 (1999).
10. K. Kurokawa, M. Naito, K. Yasuda, T. Kashiwagi, and O. Kawakubo, “A 16.8GB double-decker phase change disc, ” in Joint International Symposium on Optical Memory and Optical Data Storage 1999, S. Kubota, R. Katayama, and D. G. Stinson, eds., Proc. SPIE 3864, 197-199 (1999).
11. C. Peng, R. Liang, and M. Mansuripur, “Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements, ” Appl. Opt. 40, 5088-5099 (2001).