Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements

Applied Optics

Volumn 40, Issue 28, 2001, Pages 5088-5099

  Peng, Chubing ^a   Liang, Rongguang ^a   Erwin, J Kevin ^a   Bletscher, Warren ^a   Nagata, Kenichi ^b   Mansuripur, Masud ^a  

^a UNIVERSITY OF ARIZONA   (United States)

^b PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAM LISTINGS; FUSED SILICA; INTERFACES (MATERIALS); LIGHT ABSORPTION; LIGHT REFLECTION; LIGHT TRANSMISSION; MULTILAYERS; REFRACTIVE INDEX; SPUTTERING; SUBSTRATES; THIN FILMS; ZINC SULFIDE;

OPTICAL CONSTANTS;

OPTICAL FILMS;

EID: 0009693737     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.005088     Document Type: Article

References (16)

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