Regression criteria and their application in different modeling cases

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 5, Issue , 2002, Pages

  Leyn, Francky ^a   Lauwers, Erik ^a   Vogels, Martin ^a   Gielen, Georges ^a   Sansen, Willy ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

LEAST SQUARES APPROXIMATIONS; MAXIMUM LIKELIHOOD ESTIMATION; MEASUREMENT ERRORS; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES; REGRESSION ANALYSIS;

GAUSSIAN DISTRIBUTION; LEAST SQUARES REGRESSION; REGRESSION CRITERIA;

SEMICONDUCTOR DEVICE MODELS;

EID: 0036297263     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. SIMPAR - A versatile technology independent parameter extraction program using a new optimized fit-strategy
2. High-level analog/digital partitioning in low-power signal processing applications
3. A power estimation model for high-speed CMOS A/D converters
4. A CMOS multi-parameter biochemical microsensor with temperature control and signal interfacing