Confronting violations of the TSCG(T) in low-power design

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 4, Issue , 2002, Pages

  Kakarountas, A P ^a   Papadomanolakis, K S ^a   Nikolaidis, S ^a   Soudris, D ^a   Goutis, C E ^a  

^a UNIVERSITY OF PATRAS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

CONCURRENT ENGINEERING; DESIGN FOR TESTABILITY; EMBEDDED SYSTEMS; POWER CONTROL;

ON-LINE TESTING ARCHITECTURE; TOTALLY SELF-CHECKING GOAL;

BUILT-IN SELF TEST;

EID: 0036297040     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Probability to achieve TSC goal