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Volumn 92, Issue 3-4, 2002, Pages 151-158
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Accuracy of AFM measurements of the contour length of DNA fragments adsorbed on mica in air and in aqueous buffer
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Author keywords
Atomic force microscope (AFM); DNA contour length; Image processing
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Indexed keywords
ADSORPTION;
AIR;
CRYSTALLOGRAPHY;
DNA;
MICA;
NUCLEAR MAGNETIC RESONANCE;
CONTOUR LENGTH;
ATOMIC FORCE MICROSCOPY;
BUFFER;
DNA FRAGMENT;
MICA;
NICKEL;
ACCURACY;
ADSORPTION;
AIR;
AQUEOUS SOLUTION;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CONFORMATIONAL TRANSITION;
CONTOUR LENGTH;
CONTROLLED STUDY;
DNA HELIX;
IMAGE ANALYSIS;
IMAGE PROCESSING;
MEASUREMENT;
PHYSICAL PHENOMENA;
AIR;
ALUMINUM SILICATES;
BUFFERS;
DEOXYRIBONUCLEASE ECORI;
DEOXYRIBONUCLEASES, TYPE II SITE-SPECIFIC;
DNA;
IMAGE PROCESSING, COMPUTER-ASSISTED;
MICROSCOPY, ATOMIC FORCE;
NUCLEIC ACID CONFORMATION;
PLASMIDS;
MICA;
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EID: 0036290074
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(02)00128-6 Document Type: Article |
Times cited : (56)
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References (21)
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