메뉴 건너뛰기




Volumn 92, Issue 3-4, 2002, Pages 151-158

Accuracy of AFM measurements of the contour length of DNA fragments adsorbed on mica in air and in aqueous buffer

Author keywords

Atomic force microscope (AFM); DNA contour length; Image processing

Indexed keywords

ADSORPTION; AIR; CRYSTALLOGRAPHY; DNA; MICA; NUCLEAR MAGNETIC RESONANCE;

EID: 0036290074     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00128-6     Document Type: Article
Times cited : (56)

References (21)
  • 3
    • 0035106406 scopus 로고    scopus 로고
    • Accurate length determination of DNA molecules visualized by atomic force microscopy; evidence for a partial B- to A-form transition on mica
    • (2001) Ultramicroscopy , vol.87 , pp. 55-66
    • Rivetti, C.1    Codeluppi, S.2
  • 5
    • 0033830569 scopus 로고    scopus 로고
    • cture-function relationships in replication origins of the yeast Saccharomyces cerevisiae; higher-order structural organization of DNA in regions flanking the ARS consensus sequence
    • (2000) Mol. Gen. Genet. , vol.263 , pp. 854-866
    • Marilley, M.1
  • 9
    • 0017643940 scopus 로고
    • A new image-processing system designed for densitometry and pattern analysis of microscopic specimen. Application to the automated recognition and counting of cells in the various phases of the mitotic cycle
    • (1977) Histochemistry , vol.52 , pp. 241-258
    • Brugal, G.1    Chassery, J.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.