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Volumn , Issue , 2002, Pages 760-762

Design for reliability of micro-electro-mechanical systems (MEMS)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; OPTICAL INTERCONNECTS; RELIABILITY; SENSORS;

EID: 0036287423     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (2)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.