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Volumn 16, Issue 1, 2002, Pages 1-13
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Cyclic oligomer segregation at the metallized poly(ethylene terephthalate) surface
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Author keywords
AFM; Cyclic oligomers; Poly(ethylene terephthalate); Polymer metallization; RBS; Segregation
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
CRYSTAL GROWTH;
CRYSTALLIZATION;
DIFFUSION;
IMAGING TECHNIQUES;
METALLIZING;
NUCLEATION;
POLYETHYLENE TEREPHTHALATES;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SECONDARY ION MASS SPECTROMETRY;
SEGREGATION (METALLOGRAPHY);
OLIGOMERS;
SURFACE SEGREGATION;
CYCLIC OLIGOMERS;
OLIGOMERS;
SEGREGATION (METALLOGRAPHY);
AFM;
CHEMICAL IMAGES;
CRYSTALLIZATION PROCESS;
CYCLIC OLIGOMERS;
FAST DIFFUSION;
INHOMOGENEITIES;
METAL LAYER;
NUCLEATION AND GROWTH;
POLYMER METALLIZATION;
QUANTITATIVE DATA;
RBS;
RUTHERFORD BACKSCATTERING SPECTROMETRY;
SIMULATION TOOL;
TIME-OF-FLIGHT SECONDARY ION MASS SPECTROSCOPY;
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EID: 0036212128
PISSN: 01694243
EISSN: None
Source Type: Journal
DOI: 10.1163/15685610252771121 Document Type: Article |
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Times cited : (3)
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References (15)
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