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Volumn 56, Issue 1, 2002, Pages 24-30
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Thickness-dependent optical effects in infrared reflection-absorption spectra of a fairly thick polymer layer
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Author keywords
Infrared spectroscopy; Optical effects; Reflection absorption spectrometry; Silicon resin; Thin films
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Indexed keywords
BAND STRUCTURE;
CALCULATIONS;
ENERGY ABSORPTION;
OPTICAL PROPERTIES;
REFLECTION;
REFLECTIVE COATINGS;
REFRACTIVE INDEX;
RESINS;
SUBSTRATES;
THIN FILMS;
ABSORPTION BANDS;
DIELECTRIC RESPONSE FUNCTION;
EXTINCTION COEFFICIENT;
INFRARED REFLECTION-ABSORPTION SPECTROMETRY;
SILICON RESIN;
INFRARED SPECTROSCOPY;
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EID: 0036181444
PISSN: 00037028
EISSN: None
Source Type: Journal
DOI: 10.1366/0003702021954395 Document Type: Article |
Times cited : (14)
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References (21)
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