Biplot analysis of diallel data

Crop Science

Volumn 42, Issue 1, 2002, Pages 21-30

  Yan, Weikai ^a   Hunt, L A ^a  

^a UNIVERSITY OF GUELPH   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EMBRYOPHYTA; TRITICUM; TRITICUM AESTIVUM; ZEA; ZEA MAYS;

EID: 0036156541     PISSN: 0011183X     EISSN: None     Source Type: Journal    
DOI: 10.2135/cropsci2002.0021     Document Type: Article

References (14)

1. The biplot as a diagnostic tool for models of two-way tables
2. Combining ability of resistance to head blight caused by Fusarium culmorum (W.G. Smith) in the F1 of a seven parent diallel of winter wheat (Triticum aestivum L.)
3. Defense mechanisms of maize against pink stem borer
4. Wheat breeding nurseries, target environments, and indirect selection for grain yield
5. Diallel analysis of gene effects conditioning resistance to Stagonospora nodorum (Berk.) in wheat
6. The biplot graphic display of matrices with application to principal component analysis
7. AMMI analysis of yield trials
8. Concept of general and specific combining ability in relation to diallel crossing systems
9. GGEbiplot - A Windows application for graphical analysis of multi-environment trial data and other types of two-way data
10. Cultivar evaluation and mega-environment investigation based on the GGE biplot
11. Two types of GGE Biplots for analyzing mulit-environment trial data