Quest for an optoelectronic material: Tetragonal SixGe1-x films

Thin Solid Films

Volumn 402, Issue 1-2, 2002, Pages 143-153

  Bottomley, D J ^a   Delaunay, J J ^a   Tomita, M ^a   Hayashi, T ^a  

^a NTT CORPORATION   (Japan)

Author keywords

Electron diffraction; Germanium; Indium phosphide; Silicon

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; LATTICE CONSTANTS; OPTOELECTRONIC DEVICES; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR GROWTH;

BANDGAP;

SEMICONDUCTING FILMS;

EID: 0036147710     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01684-4     Document Type: Article

References (16)