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Volumn 402, Issue 1-2, 2002, Pages 38-42

Epitaxial Y2O3 film growth on an oxidized Si surface

Author keywords

Oxides; Yttrium

Indexed keywords

CRYSTAL STRUCTURE; EPITAXIAL GROWTH; FILM GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; NUCLEATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON; X RAY DIFFRACTION;

EID: 0036147654     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01625-X     Document Type: Letter
Times cited : (11)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.