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Volumn 402, Issue 1-2, 2002, Pages 38-42
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Epitaxial Y2O3 film growth on an oxidized Si surface
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Author keywords
Oxides; Yttrium
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Indexed keywords
CRYSTAL STRUCTURE;
EPITAXIAL GROWTH;
FILM GROWTH;
HIGH RESOLUTION ELECTRON MICROSCOPY;
NUCLEATION;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SILICON;
X RAY DIFFRACTION;
INTERFACIAL REACTIONS;
YTTRIUM COMPOUNDS;
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EID: 0036147654
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(01)01625-X Document Type: Letter |
Times cited : (11)
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References (17)
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