Thickness measurement and optical properties of very thin ZnxCd(1-x)Te layers

Semiconductor Science and Technology

Volumn 17, Issue 1, 2002, Pages 8-12

  Larramendi, E M ^a   Puron E ^a   De Melo, O ^a  

^a UNIVERSITY OF HAVANA   (Cuba)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; LIGHT EXTINCTION; LIGHT REFLECTION; REFRACTIVE INDEX; SEMICONDUCTING ZINC COMPOUNDS;

MOLAR FRACTIONS;

ULTRATHIN FILMS;

EID: 0036144251     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/17/1/302     Document Type: Article

References (15)