Nonlinear optical probing of nanocrystalline orientation in epitaxial ferroelectric thin films

Journal of Applied Physics

Volumn 91, Issue 1, 2002, Pages 362-366

  Woltersdorf, G ^a   Seifert, G ^a   Graener, H ^a   Pignolet, A ^b   Hesse, D ^b  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AZIMUTHAL ANGLE; AZIMUTHAL DEPENDENCE; AZIMUTHAL SYMMETRIES; CRYSTALLOGRAPHIC ORIENTATIONS; EPITAXIALLY GROWN; FEMTOSECONDS; FILM ORIENTATIONS; NANOCRYSTALLINES; NANOSCOPIC TEXTURES; NON-LINEAR OPTICAL; OPTICAL CHARACTERIZATION; SECOND-HARMONIC; TITANIUM:SAPPHIRE LASERS;

ELECTRON MICROSCOPY; EPITAXIAL GROWTH; FERROELECTRIC THIN FILMS; SAPPHIRE; TITANIUM; X RAY DIFFRACTION;

OPTICAL CORRELATION;

EID: 0036138193     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1420764     Document Type: Article

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