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Journal of Crystal Growth

Volumn 234, Issue 1, 2002, Pages 202-206

X-ray diffraction study of crystallographic parameters and Debye temperature of C60 single crystals

(3) Shebanovs, L a Maniks, J a Kalnacs, J b

a UNIVERSITY OF LATVIA (Latvia)

b INSTITUTE OF PHYSICAL ENERGETICS (Latvia)

Author keywords

A1. Dislocation structure; A1. Microhardness; A1. X ray diffraction; B1. Fullerenes

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL IMPURITIES; DISLOCATIONS (CRYSTALS); FULLERENES; LATTICE CONSTANTS; MICROHARDNESS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

CRYSTALLOGRAPHIC PARAMETERS; DEBYE TEMPERATURE;

CRYSTALLOGRAPHY;

EID: 0036129720 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(01)01685-2 Document Type: Article

Times cited : (14)

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