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Volumn 62, Issue 4, 1996, Pages 295-301
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High-temperature structure of C60. An in situ X-ray diffraction study
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Author keywords
[No Author keywords available]
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Indexed keywords
ACETONE;
CHEMICAL ACTIVATION;
CRYSTAL DEFECTS;
CRYSTALLIZATION;
HIGH TEMPERATURE PROPERTIES;
IN SITU PROCESSING;
LIGHT REFLECTION;
MOLECULAR STRUCTURE;
OXYGEN;
THERMAL EXPANSION;
TWINNING;
X RAY DIFFRACTION;
BRAGG INTENSITIES;
MECHANICAL MILLING;
THERMAL DESORPTION;
THERMAL EXPANSION COEFFICIENTS;
XRAY LINE PROFILE ANALYSIS;
FULLERENES;
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EID: 0030125946
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s003390050302 Document Type: Article |
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Times cited : (28)
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References (30)
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