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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 20, Issue 1, 2002, Pages 326-337

Microscopic characterization of electron field emission

(5) Nilsson, L a Groening, O a Kuettel, O a Groening, P a Schlapbach, L a

a UNIVERSITY OF FRIBOURG (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CARBON NANOTUBES; CATHODES; ELECTRIC FIELDS; FIELD EMISSION MICROSCOPES; SCANNING; STABILITY; THIN FILMS;

SCANNING ANODE FIELD EMISSION MICROSCOPE (SAFEM);

ELECTRON EMISSION;

EID: 0036122649 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.1447241 Document Type: Conference Paper

Times cited : (51)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.