A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: Repetitive, direct correlation between AFM and TEM images

Journal of Microscopy

Volumn 205, Issue 2, 2002, Pages 205-208

  Lin, A C ^a   Goh, M C ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

AFM; Atomic force microscope; Fibrous long spacing collagen; FLS; Negative staining; Sample holder; TEM; Transmission electron microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON FILMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC FORCE; ATOMIC FORCE MICROSCOPE; ATOMIC-FORCE-MICROSCOPY; FIBROUS LONG SPACING COLLAGEN; FLS; FORCE TRANSMISSION; NEGATIVE STAINING; SAMPLE HOLDERS; TRANSMISSION ELECTRON; TRANSMISSION ELECTRON MICROSCOPE;

COLLAGEN;

CARBON; COLLAGEN;

ARTICLE; ATOMIC FORCE MICROSCOPY; CORRELATION ANALYSIS; DEVICE; FILM; IMAGE ANALYSIS; IMAGING SYSTEM; PRIORITY JOURNAL; THREE DIMENSIONAL IMAGING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036122432     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.0022-2720.2001.00978.x     Document Type: Article

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