Fault detection method for the subcircuits of a cascade linear circuit

IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

Volumn 47, Issue 8, 2000, Pages 1254-1258

  Li, Feng ^a   Woo, Peng Yung ^b  

^a FUDAN UNIVERSITY   (China)

^b NORTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED NETWORK ANALYSIS; ELECTRIC ADMITTANCE; ELECTRIC NETWORK PARAMETERS; EQUIVALENT CIRCUITS; SENSITIVITY ANALYSIS;

CASCADE LINEAR CIRCUITS; FAULT DETECTION METHOD; SUBCIRCUITS;

LINEAR NETWORKS;

EID: 0034243284     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/81.873881     Document Type: Article

References (4)

1. F. Li and P. Y. Woo, "The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method," IEEE Trans. Circuits Syst. I. vol. 46, Oct. 1999.
2. P. M. Lin and Y. S. Eloherif, "Analog circuits fault dictionary-New approach and implementation," Int. J. Circuit Theory Appl., vol. 13, no. 2, 1985.
3. A. E. Solama, J. A. Starzyk, and J. W. Bandler, "A unified decomposition approach for fault location in large analog circuits," IEEE Trans. Circuits Syst. I. vol. 31, 1984.
4. T. Qzawa, "Diagnosability in decomposition approach for fault location in large analog networks," IEEE Trans. Circuits Syst. I, vol. 32, 1985.