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Volumn 197, Issue 3-4, 2002, Pages 187-192
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Post-stishovite phase boundary in SiO2 determined by in situ X-ray observations
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Author keywords
Silica; Stishovite
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Indexed keywords
DIAMOND ANVIL CELL;
P-T CONDITIONS;
PHASE TRANSITION;
SILICA;
STISHOVITE;
X-RAY DIFFRACTION;
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EID: 0036096281
PISSN: 0012821X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0012-821X(02)00479-X Document Type: Article |
Times cited : (84)
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References (31)
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