메뉴 건너뛰기




Volumn , Issue , 2002, Pages 118-121

Digital Micromirror Device (DMD) hinge memory lifetime reliability modeling

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE EQUIPMENT; DIGITAL DEVICES; FAILURE ANALYSIS; MICROOPTICS; RELIABILITY;

EID: 0036087923     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (27)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.