Filter optimization for X-ray inspection of surface-mounted ICs

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2002, Pages 377-379

  Blish II, Richard C ^a   Li, Susan X ^a   Lehtonen, David ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; INTEGRATED CIRCUIT TESTING; LUMINESCENT DEVICES; OPTICAL FILTERS; OPTIMIZATION; PRINTED CIRCUIT BOARDS; RADIATION DETECTORS; SILICON; SOLDERED JOINTS; THERMOLUMINESCENCE; X RAYS; ZINC;

X RAY INSPECTION;

SURFACE MOUNT TECHNOLOGY;

EID: 0036085588     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. Heavy ion, proton and Co-60 radiation evaluation of 16 mbit DRAM memories for space application
2. Total-dose issues for microelectronics in space systems