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Volumn , Issue , 2002, Pages 266-271

Statistical modeling and analysis of wafer test fail counts

Author keywords

Fail counts; Principal component analysis; Yield analysis; Yield improvement; Yield modeling

Indexed keywords

DATA REDUCTION; ELECTRIC NETWORK PARAMETERS; INTEGRATED CIRCUIT MANUFACTURE; PRINCIPAL COMPONENT ANALYSIS; REGRESSION ANALYSIS; SEMICONDUCTOR DEVICE MODELS; WSI CIRCUITS;

EID: 0036075550     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (5)
  • 3
    • 0021782318 scopus 로고
    • The effects of wafer to wafer defect density distribution on integrated circuit defect and fault distributions
    • (1985) IBM J. Res. Develop. , vol.29 , Issue.1 , pp. 92
    • Stapper, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.