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Volumn 1, Issue , 2002, Pages 279-282
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Linearity analysis of CMOS for RF application
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CURRENT DENSITY;
ELECTRIC CONDUCTANCE;
ELECTRIC IMPEDANCE;
LINEARIZATION;
MATHEMATICAL MODELS;
TRANSCONDUCTANCE;
OUTPUT CONDUCTANCE;
SUBSTRATE LEAKAGE NETWORK;
CMOS INTEGRATED CIRCUITS;
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EID: 0036070379
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (5)
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