Analysis of CMOS interconnections combining LE-FDTD method and SOC procedure

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 2002, Pages 879-881

  Alimenti, F ^a   Palazzari, V ^a   Placidi, P ^a   Stopponi, G ^a   Scorzoni, A ^a   Roselli, L ^a  

^a DIEI   (Italy)

Author keywords

CMOS interconnections; FDTD method; MIS transmission lines; Numerical calibration

Indexed keywords

BANDWIDTH; BOUNDARY CONDITIONS; CALIBRATION; FINITE DIFFERENCE METHOD; TIME DOMAIN ANALYSIS;

CMOS INTERCONNECTION; SHORT OPEN CALIBRATION;

CMOS INTEGRATED CIRCUITS;

EID: 0036069661     PISSN: 0149645X     EISSN: None     Source Type: Journal    
DOI: 10.1109/MWSYM.2002.1011770     Document Type: Article

References (11)

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