Hot-carrier charge trapping and reliability in high-K dielectrics

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2002, Pages 152-153

  Kumar, Arvind ^a   Ning, Tak H ^a   Fischetti, Massimo V ^a   Gusev, Evgeni ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CHARGE CARRIERS; DIELECTRIC MATERIALS; ELECTRON TRAPS; HOLE TRAPS; LIGHTING; SUBSTRATES;

COLD TUNNELING; HOT ELECTRONS;

FIELD EFFECT TRANSISTORS;

EID: 0036054244     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)