Practical next generation solution for stand-alone and embedded DRAM capacitor

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2002, Pages 114-115

  Lee, Jong Ho ^a   Lee, Jung Hyoung ^a   Kim, Yun Seok ^a   Jung, Hyung Seok ^a   Lee, Nae In ^a   Kang, Ho Kyu ^a   Suh, Kwang Pyuk ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; DYNAMIC RANDOM ACCESS STORAGE; ELECTRODES; EMBEDDED SYSTEMS; LEAKAGE CURRENTS; MIS DEVICES;

EMBEDDED CAPACITORS;

CAPACITORS;

EID: 0036045610     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)