Correlation between static and dynamic SOA (energy capability) of RESURF LDMOS devices in smart power technologies

IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD)

Volumn , Issue , 2002, Pages 125-128

  Khemka, Vishnu ^a   Parthasarathy, V ^a   Zhu, R ^a   Bose, A ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; IMPACT IONIZATION; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING;

SMART POWER TECHNOLOGY;

MOS DEVICES;

EID: 0036045601     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)