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Volumn 32, Issue , 2002, Pages 235-269

Subnanoscale studies of segregation at grain boundaries: Simulations and experiments

Author keywords

Atom probe microscopy; Lattice statics; Macroscopic and microscopic degrees of freedom; Monte Carlo simulation

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; DEGREES OF FREEDOM (MECHANICS); LATTICE CONSTANTS; MONTE CARLO METHODS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036041546     PISSN: 00846600     EISSN: None     Source Type: Journal    
DOI: 10.1146/annurev.matsci.32.011602.095455     Document Type: Review
Times cited : (59)

References (116)
  • 33
    • 0005296145 scopus 로고    scopus 로고
    • note
  • 100
    • 0005304550 scopus 로고    scopus 로고
    • Galileo Electro-Optics Corporation, Sturbridge, Massachusetts


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.