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Volumn 4693, Issue , 2002, Pages 588-597

Design issues in soi-based high-sensitivity piezoresistive cantilever devices

Author keywords

Finite element analysis; Hybridization; Mems; Micro mechanical array; Parametric design; Piezoresistive cantilevers; Stress concentration; Unlabeled detection

Indexed keywords

ALGORITHMS; CANTILEVER BEAMS; DNA; FINITE ELEMENT METHOD; MICROELECTROMECHANICAL DEVICES; SENSITIVITY ANALYSIS; SILICON ON INSULATOR TECHNOLOGY; STRESS CONCENTRATION;

EID: 0036028461     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.475257     Document Type: Article
Times cited : (15)

References (10)
  • 3
    • 0041705468 scopus 로고    scopus 로고
    • High-sensitivity cantilevers under 1000A thick
    • Harley, J.A. and T.W. Kenny. High-Sensitivity Cantilevers Under 1000A Thick. Applied Physica Letters, 1999. 75 (2): p. 289-291.
    • (1999) Applied Physica Letters , vol.75 , Issue.2 , pp. 289-291
    • Harley, J.A.1    Kenny, T.W.2
  • 9
    • 21544472129 scopus 로고
    • Atomic resolution with an atomic force microscope using piezoresistive detection
    • 22 February
    • Tortonese, et. al. Atomic Resolution with An Atomic Force Microscope Using Piezoresistive Detection. Appl. Phys. Letters. 62(8), 22 February 1993.
    • (1993) Appl. Phys. Letters , vol.62 , Issue.8
    • Tortonese1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.