Can electron paramagnetic resonance measurements predict the electrical sensitivity of SnO2-based film?

Applied Magnetic Resonance

Volumn 22, Issue 1, 2002, Pages 89-100

  Armelao, L ^a   Barreca, D ^a   Bontempi, E ^b   Canevali, C ^c   Depero, L E ^b   Mari, C M ^c   Ruffo, R ^c   Scotti, R ^c   Tondello, E ^a   Morazzoni, Franca ^c  

^a UNIVERSITY OF PADOVA   (Italy)

^b UNIVERSITY OF BRESCIA   (Italy)

^c UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON MONOXIDE; ELEMENT; OXIDE; OXYGEN; PLATINUM; RUBIDIUM; TIN; TIN DERIVATIVE;

AIR; ARTICLE; CHEMICAL STRUCTURE; CONCENTRATION (PARAMETERS); ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE; ELECTRON SPIN RESONANCE; FILM; IONIZATION; PREDICTION; REDUCTION; SPECIES; TEMPERATURE; X RAY DIFFRACTION;

EID: 0036014342     PISSN: 09379347     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF03170525     Document Type: Article

References (22)

1. Kohl D.: Sens Actuators 18, 71 (1989)
2. Mc Aleer J.F., Moseley P.T., Norris J.O.W., Williams D.E.: J. Chem. Soc. Faraday Trans. 83, 1323 (1987)
3. Mc Aleer J.F., Moseley P.T., Norris J.O.W., Williams D.E., Tofield B.C.: J. Chem. Soc. Faraday Trans. 84, 441 (1988)
4. Göpel W.: Sens. Actuators B 18/19, 1 (1994)
5. Yamazoe N., Miura N. in: Chemical Sensor Technology (Yamauchi S., ed.), vol. 4, p. 19. New York: Elsevier 1992.
6. Duh J.G., Jou J.W., Chiou B.S.: J. Electrochem. Soc. 136, 2740 (1989)
7. Matsushima S., Teraoka Y., Miura N., Yamazoe N.: Jpn. J. Appl. Phys. 27, 1798 (1989)
8. Iwamoto M. in: Chemical Sensor Technology (Yamauchi S., ed.), vol. 4, p. 63. New York: Elsevier 1992.
9. Canevali C., Chiodini N., Morazzoni F., Scotti R., Bianchi C.L.: Int. J. Inorg. Mat. 2, 355 (2000)
10. Canevali C., Chiodini N., Morazzoni F., Scotti R.: J. Mater. Chem. 7, 773 (2000)
11. Mizokawa Y., Nakamura S.: Jpn. J. Appl. Phys. 14, 779 (1975)
12. Mizokawa Y., Nakamura S.: Jpn. J. Appl. Phys., suppl. 2, pt. 2, 253 (1974)
13. Kanamori M., Suzuki K., Ohya Y., Takahashi Y.: Jpn. J. Appl. Phys. 33, 6680 (1994)
14. Canevali C., Chiodini N., Di Nola P., Morazzoni F., Scotti R., Bianchi C.L.: J. Mater. Chem. 7, 997 (1997)
15. Morazzoni F., Canevali C., Chiodini N., Mari C.M., Ruffo R., Scotti R., Armelao L., Tondello E., Depero L.E., Bontempi E.: Chem. Mater. 11, 4355 (2001)
16. Che M., Tench A.J.: Adv. Catal. 32, 1 (1983)
17. Bielansky A., Haber J.: Oxygen in Catalysis, p. 79. New York: M. Decker 1991.
18. Schirmer O.F., Scheffler M.: J. Phys. C 15, L645-L650 (1982)
19. Samson S., Fonstad C.G.: J. Appl. Phys. 44, 4618 (1973)
20. Topas P.: Bruker AXS Version 1.0.1, 1999.
21. Greenwood N.N., Earnshaw A.: Chemistry of the Elements, p. 1337. New York: Pergamon Press 1985.
22. Morazzoni F., Canevali C., Chiodini N., Mari C.M., Ruffo R., Scotti R., Armelao L., Tondello E., Depero L.E., Bontempi E.: Mater. Sci. Eng. C 15, 167 (2001)