Surface reactivity of nanostructured tin oxide and Pt-doped tin oxide as studied by EPR and XPS spectroscopies

Materials Science and Engineering C

Volumn 15, Issue 1-2, 2001, Pages 167-169

  Morazzoni, F ^a   Canevali, C ^a   Chiodini, N ^a   Mari, C ^a   Ruffo, R ^a   Scotti, R ^a   Armelao, L ^b   Tondello, E ^b   Depero, L ^c   Bontempi, E ^c  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b CNR   (Italy)

^c UNIVERSITY OF BRESCIA   (Italy)

Author keywords

EPR; Nanostructured thin films; Pt doped SnO2; XPS

Indexed keywords

DOPING (ADDITIVES); IONIZATION; NANOSTRUCTURED MATERIALS; PARAMAGNETIC RESONANCE; PLATINUM; REDUCTION; SOL-GELS; SURFACE REACTIONS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

HIGH ELECTRICAL SENSITIVITY;

TIN COMPOUNDS;

TIN OXIDE;

EID: 0034845614     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(01)00255-7     Document Type: Article

References (5)