Single power supply operated and highly reliable SONOS EEPROMs

Journal of the Korean Physical Society

Volumn 40, Issue 4, 2002, Pages 642-644

  Kim, Byungcheul ^a   Lee, Sang Eun ^b   Seo, Kwang Yell ^c  

^a Gyeongsang National University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

^c Kwangwoon University   (South Korea)

Author keywords

Channel erase; Single power supply; SONOS EEPROMS; Source drain program

Indexed keywords

EID: 0036012667     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.40.642     Document Type: Conference Paper

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