Determination of the elemental composition of mature wheat grain using a modified secondary ion mass spectrometer (SIMS)

Plant Journal

Volumn 30, Issue 2, 2002, Pages 237-245

  Heard, Peter J ^a   Feeney, Kevin A ^a   Allen, Geoffrey C ^a   Shewry, Peter R ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

Ion microanalysis; Plant; Secondary electron microscopy; Secondary ion mass spectrometry; SEM; SIMS; Wheat seed

Indexed keywords

ELECTRONS; GRAIN (AGRICULTURAL PRODUCT); MASS SPECTROMETRY; PLANT CELL CULTURE;

ELEMENTAL COMPOSITION;

PLANTS (BOTANY);

TRITICUM AESTIVUM;

STARCH; VEGETABLE PROTEIN;

ARTICLE; CHEMISTRY; CYTOLOGY; MASS SPECTROMETRY; METHODOLOGY; PLANT SEED; WHEAT;

PLANT PROTEINS; SEEDS; SPECTROMETRY, MASS, SECONDARY ION; STARCH; TRITICUM;

EID: 0035999899     PISSN: 09607412     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-313X.2001.01276.x     Document Type: Article

References (25)

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14. Protein bodies
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