Localization of chemical elements and isotopes in the leaf of soybean (Glycine max) by secondary ion mass spectrometry microscopy: Critical choice of sample preparation procedure

Journal of Microscopy

Volumn 186, Issue 1, 1997, Pages 51-66

  Grignon, N ^a   Halpern, S ^b   Jeusset, J ^b   Briancon C ^b   Fragu, P ^b  

^a INRA   (France)

^b INSTITUT GUSTAVE ROUSSY   (France)

Author keywords

Cryoprocessing; ions; isotopes; microlocalization; SIMS microscopy; soybean leaf

Indexed keywords

AMINO ACIDS; CELLS; ISOTOPES; PLANT CELL CULTURE; QUALITY CONTROL; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

CRYOPROCESSING; GLYCINE MAX; IONS DISTRIBUTION; LOCALISATION; MICROLOCALIZATION; PLANTS CELLS; SAMPLE PREPARATION PROCEDURE; SECONDARY ION MASS SPECTROMETRY MICROSCOPY; SECONDARY ION-MASS SPECTROMETRY; SOYBEAN LEAF;

IONS;

ARTIFACT; CELL COMPARTMENTALIZATION; MASS SPECTROMETRY; MICROSCOPY; NONHUMAN; PLANT LEAF; PRIORITY JOURNAL; REVIEW; SOYBEAN; TISSUE DISTRIBUTION;

EMBRYOPHYTA; GLYCINE MAX;

EID: 0030908085     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1997.1850747.x     Document Type: Review

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