Characterization of the crotalus durissus terrificus venom by atomic force microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 20, Issue 4, 2002, Pages 1317-1321

  Baranauskas, Vitor ^a   Dourado, Doroty Mesquita ^b   Jingguo, Zhao ^a   Da Cruz Höfling, Maria Alice ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b UNIVERSIDADE ANHANGUERA UNIDERP   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; COMPUTER SIMULATION; ENZYMES; MORPHOLOGY; PORE SIZE; SURFACE ROUGHNESS; SURFACE STRUCTURE;

COILED FILAMENTARY STRUCTURES; CROTALUS DURISSUS TERRIFICUS; CROTAMINE; CRYSTALLIZED CRUDE VENOM; TOXINS; VENOM;

TOXIC MATERIALS;

EID: 0035982528     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1486007     Document Type: Conference Paper

References (12)