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Volumn 11, Issue 5, 1996, Pages 371-377

Multi-element characterization of titanium(IV) oxide by electrothermal atomic absorption spectrometry, inductively coupled plasma atomic emission spectrometry, inductively coupled plasma mass spectrometry and total reflection X-ray fluorescence spectrometry after matrix-analyte separation

Author keywords

Electrothermal atomic absorption spectrometry; Inductively coupled plasma atomic emission spectrometry; Inductively coupled plasma mass spectrometry; Matrix analyte separation; Titanium(IV) oxide; Trace analysis

Indexed keywords

ABSORPTION SPECTROSCOPY; ADSORPTION; EMISSION SPECTROSCOPY; ION EXCHANGERS; MASS SPECTROMETRY; NEUTRON ACTIVATION ANALYSIS; TITANIUM OXIDES; X RAY SPECTROSCOPY;

EID: 0030143046     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/JA9961100371     Document Type: Article
Times cited : (35)

References (27)
  • 3
    • 0346112386 scopus 로고
    • eds. Miller, L. S., and Mullin, J. B., Plenum Press, New York
    • Yates, A., in Electronic Materials: From Silicon to Organics, eds. Miller, L. S., and Mullin, J. B., Plenum Press, New York, 1991, p. 499.
    • (1991) Electronic Materials: From Silicon to Organics , pp. 499
    • Yates, A.1
  • 7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.