|
|
Volumn 183, Issue 3-4, 2001, Pages 223-229
|
|
Thermally evaporated aluminium thin films
|
|
Author keywords
Aluminium thin films; Atomic force microscopy; Nucleation; Optical properties; Photoconduction; Structure and morphology thickness; Thin films
|
|
Indexed keywords
ALUMINUM;
ATOMIC FORCE MICROSCOPY;
EVAPORATION;
LIGHT TRANSMISSION;
MORPHOLOGY;
NUCLEATION;
PHOTOCONDUCTIVITY;
QUARTZ;
SURFACE ROUGHNESS;
THERMAL EFFECTS;
METAL THERMAL EVAPORATION;
THIN FILMS;
|
|
EID: 0035965607
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(01)00565-7 Document Type: Article |
|
Times cited : (50)
|
|
References (12)
|
