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Volumn 34, Issue 16, 2001, Pages 3275-3286
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Measurement of Stark broadening and shift constants of singly ionized krypton lines
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Author keywords
[No Author keywords available]
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Indexed keywords
CALCULATIONS;
CARRIER CONCENTRATION;
ELECTRON TRANSITIONS;
HELIUM;
INTERFEROMETRY;
IONS;
KRYPTON;
PLASMA DIAGNOSTICS;
PROBABILITY;
TEMPERATURE MEASUREMENT;
BOLTZMANN PLOT;
PULSED DISCHARGE LAMP;
SHIFT CONSTANTS;
STARK BROADENING;
TRANSITION PROBABILITIES;
TWO-WAVELENGTH INTERFEROMETRY;
PHYSICAL OPTICS;
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EID: 0035964137
PISSN: 09534075
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-4075/34/16/306 Document Type: Article |
Times cited : (15)
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References (26)
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