Stark width and shift measurements of visible Si III lines

Astronomy and Astrophysics

Volumn 363, Issue 3, 2000, Pages 1177-1185

  Gonzalez V R ^a   Aparicio, J A ^a   Del Val, J A ^a,b   Mar, S ^a  

^a UNIVERSITY OF VALLADOLID   (Spain)

^b UNIVERSITY OF SALAMANCA   (Spain)

Author keywords

Atomic data; Atomic processes; Line: profiles; Plasmas

Indexed keywords

EID: 4243275072     PISSN: 00046361     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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