-
5
-
-
0042078871
-
-
(1987)
J. Am. Chem. Soc.
, vol.109
, pp. 5119
-
-
Turek, P.1
Petit, P.2
André, J.-J.3
Simon, J.4
Even, R.5
Boudjema, B.6
Guillaud, G.7
Maitrot, M.8
-
33
-
-
0033349913
-
-
(1999)
Proc. IEEE Int. Conf. Dielectr. Liq. (1CDL 99)
, vol.13
, pp. 598
-
-
Yoshino, K.1
Sonoda, T.2
Lee, S.3
Hidayat, R.4
Nakayama, H.5
Tong, L.6
Fujii, A.7
Ozaki, M.8
Ban, K.9
Nishizawa, K.10
Ohta, K.11
-
41
-
-
12044254869
-
-
(1994)
J. Am. Chem. Soc.
, vol.116
, pp. 6880
-
-
Schouten, P.G.1
Warman, J.M.2
De Haas, M.P.3
Van Nostrum, C.F.4
Gelinck, G.H.5
Nolte, R.J.M.6
Copyn, M.J.7
Zwikker, J.W.8
Engel, M.K.9
Hanack, M.10
Chan, Y.H.11
Ford, W.T.12
-
53
-
-
0003438973
-
-
Bruker Analytical X-ray Instruments, Inc.: Madison, WI
-
(1998)
SAINT
-
-
-
54
-
-
0004150157
-
-
Bruker Analytical X-ray Instruments, Inc.: Madison, WI
-
(1994)
SHELXTL
-
-
-
64
-
-
4243400070
-
-
(1985)
Chem. Phys. Lett.
, vol.115
, pp. 463
-
-
André, J.-J.1
Holczer, K.2
Petit, P.3
Riou, M.-T.4
Clarisse, C.5
Even, R.6
Fourmigue, M.7
Simon, J.8
-
65
-
-
0024628834
-
-
(1989)
Synth. Met.
, vol.29
-
-
Petit, P.1
Turek, P.2
André, J.-J.3
Even, R.4
Simon, J.5
Madru, R.6
Al Sodoun, M.7
Guillaud, G.8
Maitrot, M.9
|