X-ray phase retrieval in high-resolution refraction data from amorphous materials

Applied Physics Letters

Volumn 79, Issue 13, 2001, Pages 2112-2114

  Siu, K ^b   Nikulin, A Y ^b   Tamasaku, K ^a   Ishikawa, T ^a  

^a RIKEN/SPring 8 ^*  (Japan)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035943921     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1407297     Document Type: Article

References (12)

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